Experimental Physics IV

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  6. Experimental Physics IV
  7. Equipment
  8. Scanning Probe Microscope (AFM/MFM)

Scanning Probe Microscope (AFM/MFM)

For the characterization of the magnetic domain structures and the surface morphologies of nanoscale devices and structures, we use a custom-modified Bruker Dimension ICON3 scanning probe microscope allowing for various scanning probe measurements (i.e. AFM, MFM) at room temperature.

 

Picture of AFM/MFM setup
Main components of AFM (MFM) setup
Magnetic force microscopy: concept of “lift mode” measurements.

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