Rigaku SmartLab® is a high-resolution X-ray diffractometer (XRD) with a high-flux 9 kW rotating anode X-ray source coupled with a high-energy-resolution 2D multidimensional semiconductor detector, allowing various applications including reciprocal space maps. The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. The system is dedicated for structural analysis of thin film materials.